
Field returns are chips that pass all production/manufacturing tests, but fail at customer site, or in the field during normal
manufacturer’s test suite. When the defect still remains undetected after expending tremendous resources, the field return is
declared as NTF, i.e., no-trouble-found.
Stridge has leveraged its deep silicon debug experience to develop a unique approach to quickly debug field returns and reduce
percentage of NTFs. After debugging the field returns, Stridge helps customers reduce the risk of shipping potential field returns.
Here are Stridge Failure Risk Reduction services to minimize probability of shipping bad parts that can boomerang as NTFs.
- Field Return Debug: Leverage existing test infrastructure to quickly debug field returns.
- Untested Fault Analysis: Identify and focus on critical faults to improve quality of test patterns and increase test coverage.
- Logic BIST: Stridge can make Logic BIST one of the most effective weapons for NTFs. Visit the AC DFT section for more
information.
- Memory BIST: Depending on the DFT capabilities present in the MBIST engine, Stridge can leverage it to debug NTFs.
Stridge can also design an MBIST engine to support full test & debug for Memory Arrays and NTFs. Visit the AC DFT
section for more information.
Stridge: No-Trouble-Found (NTF) Field Returns
Lots of field returns are in the shadow logic turned off during Lbist to prevent damaging the arrays, and inaccessible
during Mbist because the BIST collar is not broad enough. Stridge will devise your Lbist and Mbist to help debug NTFs.
- NTF Pre-Planning: Despite best efforts, Field Returns will appear. Stridge’s proven approach will get you ready for field
returns without increasing Production Test Costs. Stridge will plan and implement the strategy, so that you don’t fail.